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Ships within 48 hours · Estimated delivery Aug 5 - Aug 10
The pattern height is approximately 15nm
Cantilever Material: 0
± 2NM CUMULATIVE PITCH 2σ UNCERTAIN
This probe uses a rotated tip to provide a more symmetric representation of features over 200nm
These tips are sharper and last longer than any other electrical AFM probe
RTESPA-150 40 N/m The pattern height is approximately5N m, 150kHz, Symmetric Tip, Al Reflex Coating, 10 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS A pack of 10 High quality etched silicon probes for soft TappingMode and other non contact modes. Unmounted for use on standard AFM's. Bruker's flagship MPP probes are the preferred choice for high sensitivity silicon probe imaging in TappingMode or non contact mode in air. Every aspect of the MPP design has been optimized to provide the
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