Wafer Cleaving / Glass Breaking Pliers AFM and Scanning Probe Microscopy Calibration For standard grid materials such

For standard grid materials such as Cu

Completely Gold Coated

Scanning electron microscopes have a pattern that will show significant differences between backscattered and secondary electron type I and type II images

MMTMEC and MTFML DESCRIPTION

For personal use a more delicate scribe with a finer tip but a sturdy shaft and broad base (90º included angle) would be Product 54483 or 54484 depending on the scribe head angle desired

Wafer Cleaving / Glass Breaking Pliers AFM and Scanning Probe Microscopy Calibration For standard grid materials suchDESCRIPTION These light weight tweezers and pliers are non absorbent, have a positive, gentle grip, are non magnetic and the tips do not open when extra pressure is applied. They resist acetone, alcohol and most acids. Static dissipative (carbon fiber reinforced) versions are available for most models. Ideal for sample preparation, microscopy, etching, electronics, instrumentation, laboratories, forensics and delicate wafer handling. Especially useful